1 project tagged "ellipsometry"

Download No website Updated 28 Aug 2011 Regress Pro

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Regress Pro is scientific and industrial software that can be used to study experimental data coming from spectroscopic ellipsometers or reflectometers. The program has been developed mainly looking to the application of thin film measurement in semiconductor industry. The software is suitable both to determine the thickness of the layers and to determine the optical properties of dielectric materials.

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